Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy.
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DOI: 10.1021/acs.nanolett.1c02963
Abstract: Understanding the optoelectronic properties of semiconducting polymers under external strain is essential for their applications in flexible devices. Although prior studies have highlighted the impact of static and macroscopic strains, assessing the effect of a… read more here.
Keywords: microscopy; ultrafast electron; electron microscopy; scanning ultrafast ... See more keywords