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Published in 2018 at "IEEE Photonics Technology Letters"
DOI: 10.1109/lpt.2017.2787100
Abstract: A route of spatial modulation-assisted scanning white-light interferometry with the inhibition of background noises and light source fluctuations for the topography measurement of micro-/nano-structure surface was explored in this letter. The spatial modulation frequency was…
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Keywords:
modulation;
modulation assisted;
scanning white;
spatial modulation ... See more keywords
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Published in 2017 at "Applied optics"
DOI: 10.1364/ao.56.002483
Abstract: The reconstructed image of a moving sample always shows a distorted representation of reality. Therefore, one needs to calibrate, for example, out-of-plane nano-videos for quality control of nano-microelectromechanical systems (N-MEMS). Here we discuss how to…
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Keywords:
standard traceable;
transfer standard;
stroboscopic scanning;
traceable dynamic ... See more keywords