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Published in 2019 at "Solid-State Electronics"
DOI: 10.1016/j.sse.2019.03.027
Abstract: Abstract The effective mobility in 4H-SiC trench metal-oxidesemiconductor field-effect transistors (MOSFETs) with an n-channel region on the 1 1 - 00 face, corresponding to the trench sidewalls, is investigated. Using a previously proposed mobility model,…
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Keywords:
mobility;
effective mobility;
scattering mobility;
mobility sic ... See more keywords