Topological scattering singularities and embedded eigenstates for polarization control and sensing applications
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DOI: 10.1364/prj.424247
Abstract: Epsilon-near-zero and epsilon near-pole materials enable reflective systems supporting a class of symmetry-protected and accidental embedded eigenstates (EE) characterized by a diverging phase-resonance. Here we show that pairs of topologically protected scattering singularities necessarily emerge… read more here.
Keywords: scattering singularities; polarization control; control; embedded eigenstates ... See more keywords