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Published in 2022 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.2c09360
Abstract: Semiconductor metalattices consisting of a linked network of three-dimensional nanostructures with periodicities on a length scale
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Keywords:
scatterometry;
empty pore;
electron tomography;
elastic properties ... See more keywords
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Published in 2018 at "APL Materials"
DOI: 10.1063/1.5018310
Abstract: The use of optical scattering to measure feature shape and dimensions, scatterometry, is now routine during semiconductor manufacturing. Scatterometry iteratively improves an optical model structure using simulations that are compared to experimental data from an…
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Keywords:
measurement feature;
feature;
gaa transistor;
perspective optical ... See more keywords
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Published in 2019 at "Applied optics"
DOI: 10.1364/ao.58.005916
Abstract: Scatterometry is an important nonimaging and noncontact method for optical metrology. In scatterometry certain parameters of interest are determined by solving an inverse problem. This is done by minimizing a cost functional that quantifies the…
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Keywords:
problem;
feature selection;
automatic feature;
inverse problem ... See more keywords
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Published in 2021 at "Optics express"
DOI: 10.1364/oe.414584
Abstract: Defect inspection on lithographic substrates, masks, reticles, and wafers is an important quality assurance process in semiconductor manufacturing. Coherent Fourier scatterometry (CFS) using laser beams with a Gaussian spatial profile is the standard workhorse routinely…
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Keywords:
coherent fourier;
scatterometry;
angular momentum;
fourier scatterometry ... See more keywords