Comparison of Different Excitation Schemes in Bimodal Atomic Force Microscopy in Air and Liquid Environments
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DOI: 10.1007/s10338-020-00203-x
Abstract: Bimodal amplitude modulation atomic force microscopy (AM-AFM) is widely used in nanoscale topography and compositional contrast imaging for various materials. In this work, we use computational simulation to compare the dynamic behaviors of AFM cantilevers… read more here.
Keywords: microscopy; force microscopy; schemes bimodal; atomic force ... See more keywords