Articles with "secondary ion" as a keyword



Using time‐of‐flight secondary ion mass spectroscopy to investigate the reaction of alkylsulfate and alkylethoxysulfate surfactants with keratin

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Published in 2025 at "Journal of Surfactants and Detergents"

DOI: 10.1002/jsde.12856

Abstract: Time‐of‐flight secondary ion mass spectroscopy (ToF‐SIMS) was used to investigate the changes in keratin protein surface chemistry caused by the covalent bonding reactions of commercially available alkylsulfates and alkyl ethoxysulfates surfactants. Due to cystine and… read more here.

Keywords: reaction; spectroscopy; chemistry; flight secondary ... See more keywords

Time‐of‐Flight Secondary Ion Mass Spectrometry Revealing the Organocatalyst Distribution in Functionalized Silica Monoliths

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Published in 2024 at "ChemistryOpen"

DOI: 10.1002/open.202400199

Abstract: Abstract Hierarchically porous monolithic silica shows promise as a carrier material for immobilized organocatalysts. Conventional analysis usually includes physisorption, infrared spectroscopy and elemental analysis, among others, to elucidate the pore space and degree of functionalization… read more here.

Keywords: flight secondary; ion mass; distribution; mass spectrometry ... See more keywords

Investigating Pb diffusion across buried interfaces in Pb(Zr0.2Ti0.8)O3 thin films via time‐of‐flight secondary ion mass spectrometry depth profiling

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Published in 2017 at "Surface and Interface Analysis"

DOI: 10.1002/sia.6255

Abstract: The diffusion of Pb through Pb(Zr0.2Ti0.8)O3(PZT)/Pt/Ti/SiO2/Si thin film heterostructures is studied by using time-of-flight secondary ion mass spectrometry depth profiling. The as-deposited films initially contained 10 mol% Pb excess and were thermally processed at temperatures ranging… read more here.

Keywords: secondary ion; flight secondary; diffusion; mass spectrometry ... See more keywords

Depth profile study of LaAl1‐xCrxO3/SrTiO3 (x = 0, 0.2, 0.6, and 1) using time of flight secondary ion mass spectrometry (TOF‐SIMS)

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Published in 2024 at "Surface and Interface Analysis"

DOI: 10.1002/sia.7341

Abstract: The conducting two‐dimensional electron gas (2DEG) behavior in LaAlO3 (LAO)/SrTiO3 (STO) and their associated mechanisms from various aspects have brought tremendous attention in the concerned area of research. To correlate the 2DEG behavior with their… read more here.

Keywords: flight secondary; system; secondary ion; lao sto ... See more keywords

MS/MS analysis and imaging of lipids across Drosophila brain using secondary ion mass spectrometry

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Published in 2017 at "Analytical and Bioanalytical Chemistry"

DOI: 10.1007/s00216-017-0336-4

Abstract: AbstractLipids are abundant biomolecules performing central roles to maintain proper functioning of cells and biological bodies. Due to their highly complex composition, it is critical to obtain information of lipid structures in order to identify… read more here.

Keywords: secondary ion; mass spectrometry; ion; ion mass ... See more keywords

A simple correction method for isobaric interferences induced by lead during uranium isotope analysis using secondary ion mass spectrometry

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Published in 2018 at "Journal of Radioanalytical and Nuclear Chemistry"

DOI: 10.1007/s10967-018-5798-0

Abstract: Isobaric interference is a major limitation of secondary ion mass spectrometry. We developed a simple correction method for polyatomic mass interferences from lead in isotope ratio measurements of uranium. Lead-generated isobars were measured to determine… read more here.

Keywords: secondary ion; ion mass; correction method; mass ... See more keywords

Special Features of Analysis and Control of Concentration Inhomogeneity of Complexly Modified Industrial Materials by the Method of Secondary-Ion Mass Spectrometry

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Published in 2018 at "Metal Science and Heat Treatment"

DOI: 10.1007/s11041-018-0304-4

Abstract: Concentration inhomogeneity in iron-carbon alloys is analyzed and controlled. It is shown that application of secondary-ion mass spectrometers with about 200 resolution with respect to the mass numbers and a comparatively large diameter of the… read more here.

Keywords: secondary ion; mass; concentration inhomogeneity; ion ... See more keywords

Coefficients of Aluminum Diffusion into Zirconium Dioxide Determined by the Method of Secondary-Ion Mass Spectrometry

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Published in 2017 at "Russian Physics Journal"

DOI: 10.1007/s11182-017-1143-2

Abstract: The diffusion of aluminum ions into zirconium ceramics synthesized from plasma chemical 97ZrO2–3Y2O3 (mol.%) powders is studied by the method of secondary-ion mass spectrometry using a spectrometer PHI 6300. A thin aluminum film deposited on… read more here.

Keywords: secondary ion; diffusion; mass spectrometry; ion mass ... See more keywords

Time-of-flight secondary ion mass spectrometry analysis of chitosan-treated viscose fibres.

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Published in 2018 at "Analytical biochemistry"

DOI: 10.1016/j.ab.2018.07.021

Abstract: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was employed to analyse cellulose viscose fibres treated with different chitosan-based solutions. The analysis reports several new features in the TOF-SIMS spectra for systems with various forms of chitosan-treated… read more here.

Keywords: secondary ion; flight secondary; mass spectrometry; time flight ... See more keywords

Effect of sample preparation techniques upon single cell chemical imaging: A practical comparison between synchrotron radiation based X-ray fluorescence (SR-XRF) and Nanoscopic Secondary Ion Mass Spectrometry (nano-SIMS).

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Published in 2020 at "Analytica chimica acta"

DOI: 10.1016/j.aca.2020.01.054

Abstract: Analytical capabilities of Nanoscopic Secondary Ion Mass Spectrometry (nano-SIMS) and Synchrotron Radiation based X-ray Fluorescence (SR nano-XRF) techniques were compared for nanochemical imaging of polymorphonuclear human neutrophils (PMNs). PMNs were high pressure frozen (HPF), cryo-substituted,… read more here.

Keywords: secondary ion; nano; synchrotron radiation; nano sims ... See more keywords

Determination of deposition order of blue ballpoint pen lines by MeV Secondary Ion Mass Spectrometry

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Published in 2017 at "Forensic Chemistry"

DOI: 10.1016/j.forc.2017.10.004

Abstract: Abstract Secondary Ion Mass Spectrometry using MeV ion excitation was utilised for the analysis of optically indistinguishable intersecting ballpoint pen lines on paper. It was demonstrated that the technique was able to identify different colorants… read more here.

Keywords: secondary ion; mass spectrometry; mass; ion ... See more keywords