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Published in 2017 at "Journal of Nuclear Materials"
DOI: 10.1016/j.jnucmat.2017.03.011
Abstract: Abstract U-Mo alloys irradiated with 84 MeV Xe ions to various doses were characterized with transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) techniques. The TEM thin foils were prepared perpendicular to the irradiated…
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Keywords:
section tem;
microscopy;
tem characterization;
characterization high ... See more keywords