Multi-view object topography measurement with optical sectioning structured illumination microscopy.
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DOI: 10.1364/ao.58.006288
Abstract: Various optical instruments have been developed for three-dimensional (3D) surface topography, including the white light interference, reflectance confocal microscopes, and digital holographic microscopes, etc. However, the steep local slope of objects may cause the light… read more here.
Keywords: illumination microscopy; microscopy; optical sectioning; topography ... See more keywords