Charge Trapping in Amorphous Dielectrics for Secure Charge Storage.
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DOI: 10.1021/acsami.0c23083
Abstract: The fundamental scientific ingredient in the current information society is charge trapping in dielectric materials. The current data storage device known as NAND flash is based on charge trapping in silicon nitride, and it has… read more here.
Keywords: storage; secure charge; charge trapping; charge ... See more keywords