Articles with "segr seb" as a keyword



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SEGR- and SEB-hardened structure with DSPSOI in power MOSFETs

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Published in 2017 at "Journal of Semiconductors"

DOI: 10.1088/1674-4926/38/12/124006

Abstract: Single event irradiation-hardened power MOSFET is the most important device for DC/DC converter in space environment application. Single event gate rupture (SEGR) and single event burnout (SEB), which will degrade the running safety and reliability… read more here.

Keywords: power; single event; structure; power mosfets ... See more keywords