Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions
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DOI: 10.1109/tetc.2021.3114961
Abstract: Resistive Random Access Memories (ReRAMs) are considered amongst the most promising candidates to replace silicon-based memories in the near future, when huge amount of data have to be stored. However, ReRAMs suffer from reliability issues… read more here.
Keywords: reliability risks; selectors rerams; affecting selectors; selector ... See more keywords