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Published in 2025 at "Journal of Physics D: Applied Physics"
DOI: 10.1088/1361-6463/ae01b5
Abstract: In this work, low-power RRAM (Resistive random-access memory) devices were characterized by a SiO2 layer serving as an oxygen scavenging barrier, which suppresses conductive filament overgrowth and reduces operation current and power consumption. Additionally, the…
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Keywords:
forming free;
compliance forming;
scavenging barrier;
self compliance ... See more keywords