In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System
Sign Up to like & getrecommendations! Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618003677
Abstract: Nowadays, SEM-FIB systems are commonly used for TEM specimen preparation because of their advantages, for example, specific site/orientation control and time saving, as compared with traditional techniques. Besides traditional Everhart-Thornley (E-T) “secondary electron” (SE) detector,… read more here.
Keywords: specimen preparation; electron; tem specimen; sem fib ... See more keywords
Bottom-up nanoarchitectures of semiconductor nano-building blocks obtained via a controllable in situ SEM-FIB thermal soldering method
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Materials Chemistry C"
DOI: 10.1039/c7tc01668a
Abstract: Here we demonstrate that the building blocks of semiconductor WO3 nanowires can be controllably soldered together via a novel nano-soldering technique of in situ SEM-FIB thermal soldering, in which the soldering temperature can be precisely… read more here.
Keywords: situ sem; building blocks; thermal soldering; sem fib ... See more keywords