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Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618004555
Abstract: A FIB-SEM offers access to elemental and structural site-specific information at the nano-scale by the means of FIB-SEM tomography. However, as valuable as the obtainable data is, as much care has to be taken during…
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Keywords:
sem;
sem tomography;
challenges high;
fib sem ... See more keywords
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Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619005324
Abstract: The integration of energy dispersive spectrometry (EDS) and electron backscattered diffraction (EBSD) on a scanning electron microscope (SEM) are routine methods of material analysis. EDS offers chemical quantification and element spatial distribution in the form…
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Keywords:
fib sem;
fast accurate;
workflow analytic;
analytic fib ... See more keywords