Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics
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DOI: 10.1017/s1431927619010730
Abstract: Pioneering work of the Zewail group has shown it possible to study semiconductor carrier dynamics by photoexciting semiconductor materials and probing the carrier induced change of secondary electron (SE) yield in a scanning electron microscope… read more here.
Keywords: microscopy; carrier dynamics; electron; carrier ... See more keywords