Articles with "semiconductor structures" as a keyword



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Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations.

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Published in 2019 at "Ultramicroscopy"

DOI: 10.1016/j.ultramic.2019.112928

Abstract: Nowadays electron channeling contrast imaging (ECCI) is widely used to characterize crystalline defects on blanket semiconductors. Its further application in the semiconductor industry is however challenged by the emerging rise of nanoscale 3D heterostructures. In… read more here.

Keywords: contrast imaging; contrast; semiconductor; channeling contrast ... See more keywords
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Second-Harmonic Generation of Subterahertz Gyrotron Radiation by Frequency Doubling in InP:Fe and Its Application for Magnetospectroscopy of Semiconductor Structures

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Published in 2019 at "Semiconductors"

DOI: 10.1134/s1063782619090185

Abstract: The possibility of obtaining intense terahertz radiation due to second-order lattice nonlinearity in indium-phosphide crystals doped with iron is discussed. As a source of radiation, subterahertz gyrotrons are considered. It is shown that the efficiency… read more here.

Keywords: magnetospectroscopy semiconductor; subterahertz; frequency doubling; semiconductor structures ... See more keywords