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Published in 2019 at "Advanced Materials"
DOI: 10.1002/adma.201970340
Abstract: Author(s): Zhao, Peida; Wang, Ruixuan; Lien, Der‐Hsien; Zhao, Yingbo; Kim, Hyungjin; Cho, Joy; Ahn, Geun Ho; Javey, Ali
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Keywords:
scanning probe;
monolayer;
semiconductors scanning;
lithography patterning ... See more keywords