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Published in 2020 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927620019789
Abstract: With the development of fast electron sensitive cameras, a wide range of diffraction-based techniques has recently been developed for 4D-STEM [1], many of these techniques can also be employed in conventional SEMs and FIB/SEMs by…
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Keywords:
sems fib;
sub stage;
camera;
diffraction ... See more keywords