Improving Sensitivity and Productivity with High count rate X-ray spectrum images
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DOI: 10.1017/s1431927617000915
Abstract: The headline performance advantage of SDD technology and a major reason for its rapid adoption for EDS analysis is its significantly improved count rate handling capability. With older Si(Li) detectors, count rates of few 10s… read more here.
Keywords: sensitivity productivity; count rate; improving sensitivity; ray ... See more keywords