Low-Power Highly Reliable SET-Induced Dual-Node Upset-Hardened Latch and Flip-Flop
Sign Up to like & getrecommendations! Published in 2019 at "Canadian Journal of Electrical and Computer Engineering"
DOI: 10.1109/cjece.2019.2895047
Abstract: It appears that the relentless pursuit of Moore’s law scaling from one generation of process technology to the next increases circuit vulnerability to single-event transient (SET)-induced double-node upset (SEDU). In this paper, we present a… read more here.
Keywords: node upset; sedu hardened; power; flip flop ... See more keywords
Effects of Total-Ionizing-Dose Irradiation on SEU- and SET-Induced Soft Errors in Bulk 40-nm Sequential Circuits
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2016.2614963
Abstract: Synergetic effects of total-ionizing-dose irradiation on the single event upset (SEU) and single event transient (SET) performance of 40-nm sequential circuits are studied at doses up to 2 Mrad(SiO2). The impacts of input pattern and… read more here.
Keywords: seu set; set induced; total ionizing; ionizing dose ... See more keywords