Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs
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DOI: 10.1109/tns.2020.2976125
Abstract: Muon-induced single event upset (SEU) is predicted to increase with technology scaling. Although previous works investigated the dependencies of muon-induced SEU cross sections on energy, voltage, and technology, the angle of incidence of terrestrial muons… read more here.
Keywords: incidence; muon induced; cross sections; seu cross ... See more keywords