Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy
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DOI: 10.1002/jemt.24261
Abstract: Approximations of the geometry of indenting probes, particularly when using shallow indentations on soft materials, can lead to the erroneous reporting of mechanical data in atomic force microscopy (AFM). Scanning electron microscopy (SEM) identified a… read more here.
Keywords: force microscopy; microscopy; geometry; shallow indentations ... See more keywords