Shaping single atomic junctions in ultra-thin Ag structures by electromigration
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DOI: 10.1063/1.5040405
Abstract: By characterizing and manipulating the conductive properties of single Ag nano-grain boundaries with electromigration—originally considered only as a detrimental effect for metallic nanostructures—we show that atomic point contacts can be generated at well-defined locations with… read more here.
Keywords: ultra thin; shaping single; thin structures; atomic junctions ... See more keywords