Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip
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DOI: 10.1017/s1431927619014697
Abstract: Abstract Atomic force microscopy (AFM) is typically used for analysis of relatively flat surfaces with topographic features smaller than the height of the AFM tip. On flat surfaces, it is relatively easy to find the… read more here.
Keywords: microscopy; afm tip; afm; sharper afm ... See more keywords