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Published in 2020 at "Acta Materialia"
DOI: 10.1016/j.actamat.2020.02.010
Abstract: Abstract Stacking faults and the partial dislocations associated with them in a cold-rolled Mg–3wt%Bi alloy have been systematically characterized using transmission electron microscopy and high-angle annular dark-field scanning transmission electron microscopy. Intrinsic stacking faults I2…
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Keywords:
partial dislocations;
microscopy;
stacking faults;
shockley partials ... See more keywords