Memory faults using open and short defect models for nano technology applications
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DOI: 10.11591/eei.v14i5.6189
Abstract: As technology progresses from sub-micron to nanometer scales, memory-based systems are increasingly prone to faults. Consequently, developing robust methodologies to achieve defect-free embedded static random-access memory (SRAM) has become a critical challenge in modern very… read more here.
Keywords: technology; memory; short defect; open short ... See more keywords