A compact and versatile tender X-ray single-shot spectrometer for online XFEL diagnostics
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Synchrotron Radiation"
DOI: 10.1107/s1600577517012796
Abstract: A single-shot spectrometer for the tender X-ray range is presented, based on the von Hamos geometry and using elastic scattering as a fingerprint of the XFEL-produced spectrum. read more here.
Keywords: single shot; shot spectrometer; tender ray;