4H–SiC alpha spectrometry for nuclear forensics with electrodeposited sources
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DOI: 10.1007/s10967-018-6137-1
Abstract: The alpha emission spectrum of electrodeposited thin film 232Th and depleted uranium sources, including the alpha emitting 232Th decay chain daughters and 238U daughter nuclide 234U, have been measured using a thin film 4H–SiC alpha… read more here.
Keywords: enrichment; source; detector; sic alpha ... See more keywords