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Published in 2018 at "Ceramics International"
DOI: 10.1016/j.ceramint.2017.11.140
Abstract: Abstract This paper presents the research achievement in Japan to develop highly-refractive electro-ceramics for application to silicon carbide (SiC) power modules such as heat-resistive passive components (snubber capacitors and resistors), metalised substrates, ceramic circuit boards,…
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Keywords:
temperature;
power modules;
electro ceramics;
sic power ... See more keywords
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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113458
Abstract: Abstract Silicon carbide (SiC) power devices suitable for high-frequency, high-power density and high-temperature applications, and thus gain a broad prospect in the electric vehicle (EV) charger area. However, the high-frequency switching of SiC devices under…
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Keywords:
power module;
charger;
power;
emc ... See more keywords
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Published in 2020 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2020.113943
Abstract: Abstract This paper proposes the detailed analysis of the short-circuit failure mechanism of a particular class of silicon carbide (SiC) power MOSFETs, exhibiting a safe fail-to-open-circuit type signature. The results are based on extensive experimental…
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Keywords:
short circuit;
circuit;
circuit failure;
power mosfets ... See more keywords
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Published in 2021 at "IEEE Journal of Emerging and Selected Topics in Power Electronics"
DOI: 10.1109/jestpe.2020.2971623
Abstract: Silicon carbide (SiC) power devices possess many beneficial properties for power electronics applications, but commercial 62-mm SiC power module packages with the direct drop-in replacement of Si devices limit many benefits of these SiC power…
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Keywords:
power module;
low profile;
module;
power ... See more keywords
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Published in 2022 at "IEEE Journal of Emerging and Selected Topics in Power Electronics"
DOI: 10.1109/jestpe.2021.3136746
Abstract: To accelerate the broad application of silicon carbide (SiC) power MOSFETs, their short-circuit (SC) robustness and reliability must be thoroughly evaluated. This article, therefore, presents an overview of related research methods aiming to meet that…
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Keywords:
short circuit;
circuit robustness;
power;
reliability ... See more keywords
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Published in 2024 at "IEEE Journal of Emerging and Selected Topics in Power Electronics"
DOI: 10.1109/jestpe.2024.3408449
Abstract: The medium voltage (MV) silicon carbide (SiC) power modules hold significant promise as a route for the solid-state converters to achieve higher power density, higher switching frequency, and lower loss. However, the emergence of partial…
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Keywords:
sic power;
power modules;
square wave;
power ... See more keywords
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Published in 2024 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2024.3379498
Abstract: The SiC die has broad application prospects in new energy vehicles due to its excellent performances. In recent years, with the continuous development, the safety and reliability of SiC power modules have become particularly important…
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Keywords:
failure sic;
sic power;
power modules;
abnormal failure ... See more keywords
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Published in 2017 at "IEEE Transactions on Industrial Electronics"
DOI: 10.1109/tie.2017.2703910
Abstract: The reduced chip size and unipolar current conduction mechanism make silicon carbide (SiC) metal–oxide–semiconductor field-effect transistors (MOSFETs) suitable for high-frequency power electronics applications. Modeling the switching process of the SiC power MOSFET with parasitic components…
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Keywords:
high frequency;
suitable high;
power;
power mosfet ... See more keywords
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Published in 2025 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2025.3555731
Abstract: This article presents a new method for measuring the switching energies of discrete silicon carbide (SiC) power transistors based on an increase in junction temperature caused by the self-heating effect. The proposed method is introduced…
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Keywords:
power transistors;
method;
switching energy;
sic power ... See more keywords
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Published in 2021 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2021.3068196
Abstract: Both experiments and simulations have shown that single-event burnout (SEB), a catastrophic event, occurs at less than half of the rated blocking voltage in commercial 4H-SiC power devices under a heavy-ion strike. The failure was…
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Keywords:
power mosfet;
mesoplasma formation;
failure;
ion ... See more keywords
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Published in 2020 at "IEEE Transactions on Power Electronics"
DOI: 10.1109/tpel.2019.2922112
Abstract: State-of-the-art silicon carbide (SiC) power devices provide superior performance over silicon devices with much higher switching frequencies/speed and lower losses. High switching speed is preferred for achieving low switching loss, yet high dv/dt and di/dt…
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Keywords:
power devices;
level active;
power;
gate ... See more keywords