Double-sided and single-sided polished 6H-SiC wafers with subsurface damage layer studied by Mueller matrix ellipsometry
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Applied Physics"
DOI: 10.1063/5.0026124
Abstract: The complex optical constants and the subsurface damage layer of uniaxial doped 6H-SiC wafers are measured using Mueller matrix spectroscopic ellipsometry. A comparison is made between measurements on a single-sided polished wafer that can be… read more here.
Keywords: single sided; ellipsometry; subsurface damage; damage layer ... See more keywords
Simulation study of a temperature-calibrated double-sided polished optical fiber SPR refractive index sensor.
Sign Up to like & getrecommendations! Published in 2022 at "Applied optics"
DOI: 10.1364/ao.474495
Abstract: The temperature of the environment directly affects the accuracy of refractive index (RI) measurement. Therefore, we propose a double-sided polished surface plasmon resonance (SPR) RI fiber sensor, which is available for simultaneous measurement of the… read more here.
Keywords: refractive index; temperature; sided polished; double sided ... See more keywords