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Published in 2018 at "AIP Advances"
DOI: 10.1063/1.5049494
Abstract: Sidewall profile reconstruction of microstructures with the high aspect ratio is a problem urgently to be solved in MEMS field. In this paper, a measuring method based on near-infrared light scanning interferometry (NILSI) is presented…
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Keywords:
near infrared;
infrared light;
profile reconstruction;
sidewall profile ... See more keywords
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Published in 2020 at "IEEE Photonics Journal"
DOI: 10.1109/jphot.2019.2961566
Abstract: Theoretical studies of ultra-thin silicon solar cells with cylindrical, conical and parabolic surface nanostructures inherited from natural self-assembled anodic alumina oxide (NSA-AAO) were performed by finite-difference time-domain (FDTD) method. All nanostructured solar cells obtained an…
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Keywords:
solar cells;
dependent nanostructured;
ultrathin solar;
profile dependent ... See more keywords
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Published in 2017 at "Optics letters"
DOI: 10.1364/ol.42.001031
Abstract: The subwavelength grating microlens has attracted much attention due to its variety of potential applications. Instead of the vertical sidewall profile normally considered by most recent works, a tapered sidewall profile is often obtained during…
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Keywords:
subwavelength grating;
microlens taper;
tapered sidewall;
grating microlens ... See more keywords