RF Small and large signal characterization of a 3D integrated GaN/RF-SOI SPST switch
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DOI: 10.1017/s1759078721000076
Abstract: Abstract This paper presents the radio frequency (RF) measurements of an SPST switch realized in gallium nitride (GaN)/RF-SOI technology compared to its GaN/silicon (Si) equivalent. The samples are built with an innovative 3D heterogeneous integration… read more here.
Keywords: characterization; gan soi; spst switch; signal characterization ... See more keywords