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Published in 2021 at "International Journal of Microwave and Wireless Technologies"
DOI: 10.1017/s1759078721000076
Abstract: Abstract This paper presents the radio frequency (RF) measurements of an SPST switch realized in gallium nitride (GaN)/RF-SOI technology compared to its GaN/silicon (Si) equivalent. The samples are built with an innovative 3D heterogeneous integration…
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Keywords:
characterization;
gan soi;
spst switch;
signal characterization ... See more keywords