Frequency Dependent Silica Dissolution Rate Enhancement under Oscillating Pressure via an Electrochemical Pressure Solution-like, Surface Resonance Mechanism.
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DOI: 10.1021/jacs.1c11545
Abstract: From atomic force microscopy (AFM) experiments, we report a new phenomenon in which the dissolution rate of fused silica is enhanced by more than 5 orders of magnitude by simply pressing a second, dissimilar surface… read more here.
Keywords: dissolution rate; silica dissolution; dissolution; enhancement ... See more keywords