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Published in 2019 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2019.03.009
Abstract: Abstract A contactless, non-destructive approach to measure the geometrical parameters of the growth ridge, based on surface topography, is presented and established. It allows a systematic, large scale analysis of growth ridges of single crystals…
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Keywords:
growth;
geometry;
gradient growth;
growth ridges ... See more keywords
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Published in 2020 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2020.125842
Abstract: Abstract Based on own previous studies on dislocation generation in FZ- silicon crystals and in order to verify the location and conditions of dislocation generation and spreading, in the current work we present results from…
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Keywords:
dislocation generation;
silicon crystals;
dislocation;
generation ... See more keywords
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Published in 2020 at "Physics of the Solid State"
DOI: 10.1134/s1063783420110396
Abstract: We obtained a Raman spectrum for a surface layer of porous carbon ceramic (porosity ≈5%) of ≈80 nm thick. The analysis of the spectrum showed that the ceramics contain crystals of silicon carbide 6H‑SiC and silicon.…
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Keywords:
fractoluminescence;
silicon crystals;
carbon;
destruction ... See more keywords
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Published in 2019 at "Journal of Communications Technology and Electronics"
DOI: 10.1134/s1064226919030203
Abstract: A new technology of nanostructuring and modification of the surfaces of silicon crystals of different types of conduction, using self-organized carbon mask coatings and highly anisotropic plasma-chemical etching is proposed. It is shown that the…
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Keywords:
field;
crystals different;
field emission;
conduction ... See more keywords