Finding unstrained 10 -nm lattice defects in silicon, given 1011 per cubic centimeter
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DOI: 10.1017/s1431927617008157
Abstract: Our ability to image individual atoms and atom-columns only brings the practical problem of finding a statistically-useful number of nanoscale structures into sharper focus. In crystalline materials like metals and semiconductors, a key tool for… read more here.
Keywords: silicon given; lattice defects; unstrained lattice; defects silicon ... See more keywords