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Published in 2020 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2019.125378
Abstract: Abstract Three different SiO2-based barrier layers, used in industry for prevention of metallic impurity diffusion into directionally solidified silicon ingots, were investigated in detail by G1 experiments in order to find out the most relevant…
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Keywords:
different sio2;
barrier;
diffusion;
barrier layers ... See more keywords
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Published in 2018 at "Journal of Semiconductors"
DOI: 10.1088/1674-4926/39/8/083004
Abstract: We characterized strip-like shadows in cast multicrystalline silicon (mc-Si) ingots. Blocks and wafers were analyzed using scanning infrared microscopy, photoluminescence spectroscopy, laser scanning confocal microscopy, field-emission scanning electron microscopy, X-ray energy-dispersive spectrometry, and microwave photoconductivity…
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Keywords:
efficiency;
silicon ingots;
multicrystalline silicon;
microscopy ... See more keywords