Amorphous/Crystalline Silicon Interface Stability: Correlation between Infrared Spectroscopy and Electronic Passivation Properties
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DOI: 10.1002/admi.202000957
Abstract: This research was funded by Swiss SCIEX-NMSch fellowship (Grant No. 11.223), by Czech Science Foundation (Grant No. 18-24268S), and Czech Ministry of Education, Youth and Sports (Grant Nos. CZ. 02.1.01/0.0/0.0/15_003/0000464−“Centre of Advanced Photovoltaics”, and CZ.02.1.01/0.0/0.0/16_019/0000760–“SOLID21”.… read more here.
Keywords: crystalline silicon; interface stability; stability correlation; silicon interface ... See more keywords