Improvement of two-dimensional structured illumination microscopy with an incoherent illumination pattern of tunable frequency.
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DOI: 10.1364/ao.57.000b92
Abstract: In two-dimensional structured illumination microscopy (2D-SIM), high-resolution images with optimal optical sectioning (OS) cannot be obtained simultaneously. This tradeoff can be overcome by using a tunable-frequency 2D-SIM system and a proper reconstruction method. The goal… read more here.
Keywords: microscopy; illumination; tunable frequency; sim system ... See more keywords