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Published in 2019 at "Surface and Interface Analysis"
DOI: 10.1002/sia.6739
Abstract: Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) was employed for an analysis of the rare earth element Ce in pure iron and steel. Secondary ion images showed that the amount of the segregation of Ce and…
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Keywords:
analysis chemical;
sims analysis;
tof sims;
steel ... See more keywords
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Published in 2019 at "Technical Physics Letters"
DOI: 10.1134/s1063785019010231
Abstract: New possibilities offered by the method of secondary ion mass spectrometry (SIMS) for analysis of the phase composition of carbon-containing materials are considered. Differences are established between the mass spectra of three carbon phases: diamond,…
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Keywords:
composition carbon;
analysis phase;
phase composition;
carbon ... See more keywords