Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence
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DOI: 10.1021/acs.nanolett.2c04004
Abstract: Time-resolved analysis of photon cross-correlation function g(2)(τ) is applied to photoluminescence (PL) of individual submicrometer size MAPbI3 perovskite crystals. Surprisingly, an antibunching effect in the long-living tail of PL is observed, while the prompt PL… read more here.
Keywords: photoluminescence; single charge; charge; charge trapping ... See more keywords