Articles with "single event" as a keyword



Mitigating the thermally induced single event crosstalk

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Published in 2017 at "Analog Integrated Circuits and Signal Processing"

DOI: 10.1007/s10470-017-0992-5

Abstract: With advances in technology scaling, circuits become increasingly more sensitive to transient pulses caused by single event (SE) particles. With scaling, interconnects are also being laid closer to each other causing increased cross-coupling noise effects.… read more here.

Keywords: noise effects; thermally induced; crosstalk noise; crosstalk ... See more keywords

Updated structure of vertical double-diffused MOSFETs for irradiation hardening against single events

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Published in 2018 at "Journal of Computational Electronics"

DOI: 10.1007/s10825-018-1224-7

Abstract: The gate oxide layer and parasitic bipolar junction transistor are inherent elements of vertical double-diffused power metal–oxide–semiconductor field-effect transistors (MOSFETs). Single-event gate rupture (SEGR) and single-event burnout (SEB) may be triggered by penetration of energetic… read more here.

Keywords: layer; power; single event; vertical double ... See more keywords

Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM

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Published in 2017 at "Science China Information Sciences"

DOI: 10.1007/s11432-017-9549-8

Abstract: Dear editor, In custom static random access memory (SRAM) cell, radiation-induced single bit upsets (SBUs) are considered as the main cause of soft error [1]. Advanced technologies and scaling down of feature sizes have made… read more here.

Keywords: mcu; well contact; density; sram ... See more keywords
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The connection between space weather and Single Event Upsets in polar low earth orbit satellites

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Published in 2021 at "Advances in Space Research"

DOI: 10.1016/j.asr.2021.02.007

Abstract: Abstract Space weather is driven and modulated by the activity in the Sun. Space weather events have the potential to inflict critical damage to space systems. Nowadays, space assets are essential in our basic needs,… read more here.

Keywords: space weather; single event; space; event upsets ... See more keywords

Total ionization dose and single event effects of a commercial stand-alone 4 Mb resistive random access memory (ReRAM)

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Published in 2019 at "Microelectronics Reliability"

DOI: 10.1016/j.microrel.2019.113443

Abstract: Abstract Experiments on total ionizing dose (TID) by cobalt-60 and single event effects (SEE) by pulsed laser and heavy ions were conducted on a 4 Mb commercial ReRAM from Fujitsu. The bit cell features two-transistor-two-resistor (2T2R)… read more here.

Keywords: total ionization; ionization dose; reram; event effects ... See more keywords

Analysis of single-event effects in selected BOX-based FDSOI transistor and inverter

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Published in 2021 at "Radiation Physics and Chemistry"

DOI: 10.1016/j.radphyschem.2021.109526

Abstract: Abstract The existence of buried oxide aggravates the self-heating effect (SHE) in fully depleted silicon-on-insulator (FDSOI) device. To reduce SHE, a new structure named selected BOX-based (SELBOX) FDSOI transistor is introduced in this work, and… read more here.

Keywords: single event; selected box; fdsoi transistor; transistor ... See more keywords

Single-Event Kinetic Modeling of Olefin Cracking on ZSM-5: Proof of Feed Independence

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Published in 2017 at "Industrial & Engineering Chemistry Research"

DOI: 10.1021/acs.iecr.7b01344

Abstract: One of the crucial advantages of single-event kinetic models is the possibility of extrapolating them to other reaction conditions, which is highly interesting for catalyst design. However, no publication exists that proves the theoretically derived… read more here.

Keywords: olefin; cracking zsm; single event; event kinetic ... See more keywords
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Detection of microplastics using inductively coupled plasma-mass spectrometry (ICP-MS) operated in single-event mode

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Published in 2020 at "Journal of Analytical Atomic Spectrometry"

DOI: 10.1039/c9ja00379g

Abstract: The occurrence of microplastics in many, if not all environmental compartments is a matter of increasing concern and deserves proper attention. However, there is still a lack of analytical tools for straightforward monitoring of these… read more here.

Keywords: icp; event mode; mass; single event ... See more keywords

Investigation of proton single-event transient in CMOS image sensor

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Published in 2024 at "AIP Advances"

DOI: 10.1063/5.0184659

Abstract: With the increasingly widespread application of CMOS image sensors (CIS) in radiation environments, such as aerospace, their radiation effects have gained attention. This paper investigates single-event transient (SET) caused by the proton direct ionization on… read more here.

Keywords: cmos image; single event; proton; event transient ... See more keywords

Analysis of the single-event effects in β-Ga2O3 Schottky barrier diodes

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Published in 2025 at "Applied Physics Letters"

DOI: 10.1063/5.0283627

Abstract: This work presents the investigation of the single-event effects in β-Ga2O3 Schottky barrier diodes (SBDs) under heavy-ion irradiation with a reverse bias voltage of 100 V. The research focuses on the performance degradation and underlying mechanisms… read more here.

Keywords: single event; schottky barrier; ga2o3 schottky; irradiation ... See more keywords
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Prediction of single event upset critical charge and sensitive volume depth by energy deposition analysis of low energy protons

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Published in 2020 at "Radiation Effects and Defects in Solids"

DOI: 10.1080/10420150.2020.1806838

Abstract: Single Event Upset (SEU) critical charge and sensitive volume depth of 65-nm CMOS bulk SRAM are predicted through energy deposition analysis of low energy protons. The deposited energy distributions of protons calculated by GEANT4 are… read more here.

Keywords: sensitive volume; critical charge; energy; volume depth ... See more keywords