Mitigating the thermally induced single event crosstalk
Sign Up to like & getrecommendations! Published in 2017 at "Analog Integrated Circuits and Signal Processing"
DOI: 10.1007/s10470-017-0992-5
Abstract: With advances in technology scaling, circuits become increasingly more sensitive to transient pulses caused by single event (SE) particles. With scaling, interconnects are also being laid closer to each other causing increased cross-coupling noise effects.… read more here.
Keywords: noise effects; thermally induced; crosstalk noise; crosstalk ... See more keywords
Updated structure of vertical double-diffused MOSFETs for irradiation hardening against single events
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Computational Electronics"
DOI: 10.1007/s10825-018-1224-7
Abstract: The gate oxide layer and parasitic bipolar junction transistor are inherent elements of vertical double-diffused power metal–oxide–semiconductor field-effect transistors (MOSFETs). Single-event gate rupture (SEGR) and single-event burnout (SEB) may be triggered by penetration of energetic… read more here.
Keywords: layer; power; single event; vertical double ... See more keywords
Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM
Sign Up to like & getrecommendations! Published in 2017 at "Science China Information Sciences"
DOI: 10.1007/s11432-017-9549-8
Abstract: Dear editor, In custom static random access memory (SRAM) cell, radiation-induced single bit upsets (SBUs) are considered as the main cause of soft error [1]. Advanced technologies and scaling down of feature sizes have made… read more here.
Keywords: mcu; well contact; density; sram ... See more keywords
The connection between space weather and Single Event Upsets in polar low earth orbit satellites
Sign Up to like & getrecommendations! Published in 2021 at "Advances in Space Research"
DOI: 10.1016/j.asr.2021.02.007
Abstract: Abstract Space weather is driven and modulated by the activity in the Sun. Space weather events have the potential to inflict critical damage to space systems. Nowadays, space assets are essential in our basic needs,… read more here.
Keywords: space weather; single event; space; event upsets ... See more keywords
Total ionization dose and single event effects of a commercial stand-alone 4 Mb resistive random access memory (ReRAM)
Sign Up to like & getrecommendations! Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113443
Abstract: Abstract Experiments on total ionizing dose (TID) by cobalt-60 and single event effects (SEE) by pulsed laser and heavy ions were conducted on a 4 Mb commercial ReRAM from Fujitsu. The bit cell features two-transistor-two-resistor (2T2R)… read more here.
Keywords: total ionization; ionization dose; reram; event effects ... See more keywords
Analysis of single-event effects in selected BOX-based FDSOI transistor and inverter
Sign Up to like & getrecommendations! Published in 2021 at "Radiation Physics and Chemistry"
DOI: 10.1016/j.radphyschem.2021.109526
Abstract: Abstract The existence of buried oxide aggravates the self-heating effect (SHE) in fully depleted silicon-on-insulator (FDSOI) device. To reduce SHE, a new structure named selected BOX-based (SELBOX) FDSOI transistor is introduced in this work, and… read more here.
Keywords: single event; selected box; fdsoi transistor; transistor ... See more keywords
Single-Event Kinetic Modeling of Olefin Cracking on ZSM-5: Proof of Feed Independence
Sign Up to like & getrecommendations! Published in 2017 at "Industrial & Engineering Chemistry Research"
DOI: 10.1021/acs.iecr.7b01344
Abstract: One of the crucial advantages of single-event kinetic models is the possibility of extrapolating them to other reaction conditions, which is highly interesting for catalyst design. However, no publication exists that proves the theoretically derived… read more here.
Keywords: olefin; cracking zsm; single event; event kinetic ... See more keywords
Detection of microplastics using inductively coupled plasma-mass spectrometry (ICP-MS) operated in single-event mode
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Analytical Atomic Spectrometry"
DOI: 10.1039/c9ja00379g
Abstract: The occurrence of microplastics in many, if not all environmental compartments is a matter of increasing concern and deserves proper attention. However, there is still a lack of analytical tools for straightforward monitoring of these… read more here.
Keywords: icp; event mode; mass; single event ... See more keywords
Prediction of single event upset critical charge and sensitive volume depth by energy deposition analysis of low energy protons
Sign Up to like & getrecommendations! Published in 2020 at "Radiation Effects and Defects in Solids"
DOI: 10.1080/10420150.2020.1806838
Abstract: Single Event Upset (SEU) critical charge and sensitive volume depth of 65-nm CMOS bulk SRAM are predicted through energy deposition analysis of low energy protons. The deposited energy distributions of protons calculated by GEANT4 are… read more here.
Keywords: sensitive volume; critical charge; energy; volume depth ... See more keywords
Single event effects prediction of MOSFET device using deep learning
Sign Up to like & getrecommendations! Published in 2022 at "Nanotechnology"
DOI: 10.1088/1361-6528/ac9287
Abstract: Single event effect (SEE) is an important problem in the reliability research of integrated circuits. The study of SEE of traditional MOSFET devices is mainly based on simulation software, which is characterized by slow simulation… read more here.
Keywords: transient current; single event; mosfet; deep learning ... See more keywords
SEGR- and SEB-hardened structure with DSPSOI in power MOSFETs
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Semiconductors"
DOI: 10.1088/1674-4926/38/12/124006
Abstract: Single event irradiation-hardened power MOSFET is the most important device for DC/DC converter in space environment application. Single event gate rupture (SEGR) and single event burnout (SEB), which will degrade the running safety and reliability… read more here.
Keywords: power; single event; structure; power mosfets ... See more keywords