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Published in 2021 at "Advanced Electronic Materials"
DOI: 10.1002/aelm.202000858
Abstract: In small‐area transistors, the trapping/detrapping of charge carriers to/from a single trap located in the gate oxide near the Si/SiO2 interface leads to the discrete switching of the transistor drain current, known as single‐trap phenomena…
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Keywords:
liquid gated;
single trap;
trap;
charge carriers ... See more keywords