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Published in 2019 at "Ceramics International"
DOI: 10.1016/j.ceramint.2019.01.027
Abstract: Abstract Thin film encapsulation (TFE) using a multilayer film composed of SiOx and SiNxOyCz layers deposited by plasma-enhanced atomic layer deposition is demonstrated. To investigate the mechanism of suppressed moisture penetration for the multilayer film,…
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Keywords:
siox sinxoycz;
plasma enhanced;
multilayer film;
layer ... See more keywords