In-situ Device-level TEM Characterization Based on Ultra-flexible Multilayer MoS2 Micro-cantilever.
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DOI: 10.1002/adma.202301439
Abstract: Current state-of-the-art in-situ TEM characterization technology has been capable of statically or dynamically nanorobotic manipulating specimens, affording abundant atom-level material attributes. However, an insurmountable barrier between material attributes investigations and device-level application explorations exists due… read more here.
Keywords: tem; situ device; characterization; device level ... See more keywords