Sign Up to like & get
recommendations!
0
Published in 2017 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2016.2625598
Abstract: In order to achieve high tolerance against process, voltage, and temperature variations in the ultralow voltage (ULV) circuits, in situ error detection and correction (EDAC) techniques were presented. However, circuits adding the capability of error…
read more here.
Keywords:
error detection;
situ error;
detection;
ultralow voltage ... See more keywords