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Published in 2019 at "Journal of Alloys and Compounds"
DOI: 10.1016/j.jallcom.2019.03.015
Abstract: Abstract In this study, in-situ phosphorus-doped Si 1 − x C x layers were epitaxially grown on blanket and patterned Si wafers using reduced pressure chemical vapor deposition (RPCVD). The effect of post-growth annealing on…
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Keywords:
strain microstructures;
thermal annealing;
strain;
situ phosphorus ... See more keywords
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Published in 2018 at "Thin Solid Films"
DOI: 10.1016/j.tsf.2017.10.013
Abstract: Abstract We report the epitaxy of n-Ge layer with in situ phosphorus (P)-doping using metal-organic chemical vapor deposition (MOCVD) method with tertiary-butyl-germane and tri-ethyl-phosphine precursors. The crystalline and electrical properties of n-Ge epitaxial layers have…
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Keywords:
using metal;
metal organic;
situ;
organic chemical ... See more keywords
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Published in 2021 at "Applied Physics Express"
DOI: 10.35848/1882-0786/abd718
Abstract: In situ phosphorus-doped silicon (ISPD) has been actively investigated as a source/drain material. However, defect formation during the epitaxial growth of ISPD layers in 3D structures deteriorate the device performance. In this study, we investigate…
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Keywords:
phosphorus doped;
doped silicon;
laser annealing;
situ phosphorus ... See more keywords