In situ Polarized Neutron Reflectometry: Epitaxial Thin-Film Growth of Fe on Cu(001) by dc Magnetron Sputtering
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DOI: 10.1103/physrevapplied.7.054004
Abstract: The step-wise growth of epitaxial Fe on Cu(001)/Si(001), investigated by in-situ polarized neutron reflectometry is presented. A sputter deposition system was integrated into the neutron reflectometer AMOR at the Swiss neutron spallation source SINQ, which… read more here.
Keywords: neutron reflectometry; growth; reflectometry epitaxial; film ... See more keywords