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Published in 2017 at "Journal of Micro and Nano-Manufacturing"
DOI: 10.1115/1.4037124
Abstract: One of the greatest challenges in the manufacturing and development of nanotechnologies is the requirement for robust, reliable, and accurate characterization data. Presented here are the results of an interlaboratory comparison (ILC) brought about through…
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Keywords:
nanoparticle tracking;
tracking analysis;
nanoparticle sizing;
nanoparticle ... See more keywords