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Published in 2018 at "IUCrJ"
DOI: 10.1107/s2052252518010837
Abstract: Rayleigh-scattering microscopy permits tracking and sizing of aerosolized particles down to 40 nm in diameter. It lays the foundation for lab-based injector development and online injection diagnostics for X-ray free-electron laser (XFEL) research.
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Keywords:
microscopy;
sizing nanoparticles;
rayleigh scattering;
tracking sizing ... See more keywords